EIKOS

The Atom Probe that enables routine, high performance 3D nano-analysis for both research and industry

Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA has developed EIKOS™, the Atom Probe microscope for rapid alloy development and nanoscale materials research.


The EIKOS Atom Probe offers:

  • Three-dimensional tomography with nanoscale characterization of microstructures
  • High spatial resolution single atom detection with high efficiency
  • Equal sensitivity to all elements and their isotopes
  • Quantitative composition measurement (sub-nm to near micron scale)
  • Available in voltage or voltage & laser configurations
  • Standard specimen preparation methods


EIKOS is available in 2 configurations:

EIKOS
The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications.

EIKOS-UV
The fully configured EIKOS-UV system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated 355 nm laser pulsing module with computer controlled focused spot design to provide access to a larger application range.

The base EIKOS system is field upgradable to the EIKOS-UV.

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