Quantro ESEM

ESEM for Materials Study

PT Wadya Prima Mulia as the Authorized Distributor for ThermoFisher Scientific in Indonesia, provides Verios 5 XHR Scanning Electron Microscope

Environmental scanning electron microscope (ESEM) for the study of materials in their natural state.

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Quattro Environmental Scanning Electron Microscope

The Thermo Scientific Quattro ESEM combines all-around performance in imaging and analytics with a unique environmental mode (ESEM) that allows samples to be studied in their natural state. It is ideal for a wide variety of academic, industrial, and government labs that want the versatility and ease of use needed for multiple users of different experience levels and disciplines on a platform that also supports unique in situ experiments. The Quattro ESEM features a field emission gun (FEG), which ensures excellent resolution. Meanwhile, its three vacuum modes (high vacuum, low vacuum, and ESEM) provide the flexibility to accommodate the widest range of samples of any SEM available, including those that are outgassing or otherwise not vacuum-compatible.

Best in class for in situ imaging capabilities, dynamic experiments with excellent analytical capabilities

The Quattro ESEM is a highly flexible platform for in situ dynamic experiments. The Quattro ESEM’s environmental SEM capability allows scientists to study materials in a range of conditions, such as wet/humid, hot, or reactive environments, as they develop new materials and products. It supports cooling and heating experiments both in high vacuum and low vacuum to accommodate the widest range of needs. Cooling experiments on wet materials are possible with the Peltier cooling stage or if the transmission mode is needed, with Thermo Scientific WetSTEM Technology. Additionally, the Quattro ESEM provides several different possibilities to heat the samples of interest, both bulk and powders. Users can perform dynamic experiments at high temperatures both in high vacuum (with the high-vacuum heating stage), in low-vacuum/ESEM mode (with the two ESEM heating stages for temperatures up to 1,000°C and 1,400°C), and on a localized area for better control of the temperature change (with the Thermo Scientific µHeater Holder).

Thanks to the Quattro ESEM chamber size, it accommodates a wide range of accessories. Analytical capabilities include energy dispersive X-ray spectroscopy (EDS) with ports for 180-degree dual EDS attachment, electron backscatter diffraction (EBSD) coplanar with EDS, and wavelength dispersive X-ray spectroscopy (WDS). Furthermore, the Quattro ESEM comes with the new Thermo Scientific ChemiSEM Technology, a unique live elemental imaging capability that is fully integrated into the SEM user interface, providing always-available compositional information through the most intuitive interface.

Diverse material application observed with the Quattro ESEM

Metals and alloys (metallic filter).
Additive manufacturing powder.
Soft materials (polymeric fibers).
Biological samples (mold spores).
Geological materials (diamonds).
Minerals (shell’s surface).
Ceramics (zirconia in a thermal barrier coating).
Soft materials (cross section of a tire).
Chemicals (zinc oxide nanoparticles assembled into platelets).

Dynamic in situ experiments

In situ study of materials in their natural state: unique high-resolution FEG-SEM with environmental mode (ESEM). In situ analysis at temperatures ranging from -165°C to 1,400°C with a range of cryo, Peltier, and heating stages.

Peltier cooling experiment of sodium sulfate crystals in sandstone.

In situ cooling experiment conducted on a sandstone sample with crystals of sodium sulfate. The target of the experiment was to study the sodium sulfate  behavior when completely hydrated. The pressure was varied up to 700 Pa, maintaining the temperature at 2˚C. Sample courtesy of Institute of Theoretical and Applied Mechanics of the Academy of Science, Czech Republic.

μHeater Holder heating experiment of magnetite and hematite.

Heating experiment run with the μHeater Holder. The video shows the heating of a mix of magnetite and hematite from 40˚C up to 1,000˚C.

Wide range of information

Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation. Several additional detectors, such as the STEM3+ detector and the retractable RGB cathodoluminescence (CL) detector are available to accommodate every user’s need and provide a complete set of information from a wide range of materials.

Material contrast from a mix of different metals.
Bright field (BF) STEM3+ image of a biological section of a planarian.
CL image of diamonds.

Excellent analytical capabilities

Excellent analytical capabilities with a flexible chamber that allows multiple EDS, EBSD, or WDS detectors. Elemental information at your fingertips with ChemiSEM Technology, which provides live, quantitative, elemental mapping for unprecedented time to result and ease of use. Excellent analysis of non-conductive samples: accurate EDS and EBSD are enabled in low vacuum with the Quattro ESEM’s through-the-lens pumping.

ChemiSEM image of dental filling material, showing a mixture of Hg, Cu, Sn and Ag.
EBSD on ceramic materials in low vacuum.

Minimize sample preparation time with the unique combination of high-vacuum, low-vacuum, and environmental modes

Polymeric fibers (low vacuum imaging, 80 Pa).
Hydrated mold sporesHydrated mold spores (ESEM imaging, 800 Pa). (ESEM imaging, 800 Pa).
Salts on bacon (ESEM imaging, 700 Pa).

Ease of use with innovative options and advanced automation

Easy to use, intuitive software with User Guidance. The unique Undo function permits efficient exploration of imaging conditions and allows you to work faster with fewer mouse clicks.

Optimize your work and feel free to explore the imaging condition with the unique Undo function.

Advanced automation

Advanced automation is provided in different ways, with either Thermo Scientific AutoScript 4 Software or Thermo Scientific Maps Software, depending on the specific application needs.

AutoScript 4 Software offers control of the Quattro ESEM. Take advantage of a Python-based application programming interface (API) to optimize your in situ cooling or heating experiments or record and monitor dynamic parameters such as temperature, stage position, or pressure.

Maps Software automates large-area acquisition on multiple samples with up to four different simultaneous signals. In addition to a clear increase in the system productivity, it offers a multi-scale, multi-layered visualization environment in which 2D and 3D data and imagery can be imported from any source to correlate different modalities.

Live drift compensation with AutoScript 4 Software on an ESEM heating stage experiment.

ESEM heating stage experiment on a silver wire, heated from 300˚C to 530˚C. AutoScript 4 Software was used to obtain a live drift compensation through a combination of beam shift and stage moves. The result was a stable image of the silver wire for the whole duration of the movie, even when the wire changed location over the substrate.

Resolution• High-vacuum imaging
→ 0.8 nm at 30 kV (STEM)
→ 1.0 nm at 30 kV (SE) in high vacuum
→ 1.3 nm at 30 kV (SE) in low vacuum and ESEM mode
→ 3.0 nm at 1 kV (SE)
Standard detectorsETD, low-vacuum SED (LVD), gaseous SED for ESEM mode (GSED), IR camera
Optional detectorsNav-Cam+, DBS, DBS-GAD, ESEM-GAD, ICD, STEM 3+, WetSTEM, RGB-CLD, EDS, EBSD, WDS, Raman, EBIC, etc.
ChemiSEM Technology (optional)Live quantitative SEM image coloring is available based on energy-dispersive X-ray spectroscopy (EDS). Point & ID, linescan, region, element maps and accurate Noran quantification are included.
Stage bias (beam deceleration, optional)-4000 V to +50 V
Low vacuum modeUp to 2600 Pa (H2O) or 4000 Pa (N2)
Stage5-axis motorized eucentric stage, 110 x 110 mm2 with a 105° tilt range. Maximum sample weight: 5 kg in un-tilted position.
Standard sample holderStandard multi-sample SEM holder uniquely mounts directly onto the stage, hosts up to 18 standard stubs (⌀ 12 mm), does not require tools to mount a sample
Chamber340 mm inside width, 12 ports, three simultaneous EDS detectors possible, two at 180°, coplanar EDS/EBSD orthogonal to the tilt axis of the stage
In situ accessories (optional)• Software controlled -20° C to +60° C Peltier cold stage
• Software controlled 1000° C low vacuum/ESEM heating stage
• Software controlled 1100° C high vacuum heating stage
• Software controlled 1400° C low vacuum/ESEM heating stage
• Integrated gas injection: up to 2 units (other accessories may limit number of GIS available) for beam-induced deposition of the following materials:
→ Platinum
→ Tungsten
→ Carbon
• Manipulators
• Cryo-stage
• Electrical probing / multi-probing stations
Software optionsMaps Software for automatic large area acquisition using tiling and stitching; correlative work
AutoScript 4 Software; a Python-based application programming interface
• Pattern generation software
• Thermo Scientific TopoMaps Software for image colorization, image analysis and 3D surface reconstruction

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

Semiconductor research and development

Innovation starts with research and development. Learn more about solutions to help you understand innovative structures and materials at the atomic level.

Semiconductor metrology

Manufacturing today’s complex semiconductors requires exact process controls. Learn more about advanced metrology and analysis solutions to accelerate yield learnings.

Semiconductor Failure Analysis

Complex semiconductor device structures result in more places for defects to hide. Learn more about failure analysis solutions to isolate, analyze, and repair defects.

Semiconductor materials characterization

Many factors impact yield, performance, and reliability. Learn more about solutions to characterize physical, structural, and chemical properties.

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